نوع مقاله : علمی-پژوهشی
نویسنده
گروه مهندسی برق و انرژی، دانشکده فنی و مهندسی، دانشگاه بناب، بناب، ایران
چکیده
کلیدواژهها
موضوعات
عنوان مقاله [English]
نویسنده [English]
This work presents a novel and high-precision technique for capacitance measurement based on converting the capacitance charge to current. For capacitance detection, unlike the conventional methods that utilized transistors to control the charging and discharging process of capacitance, a dynamic supply voltage is employed. Eliminating the controlling transistors removes their parasitic capacitance effect, thereby improving the precision of the detection process and enabling operation at higher frequencies. Meanwhile, the consumed area will be diminished and making it a good candidate for the implementation of an array of sensors. Also, the current mirror stage incorporates a comparator to diminish channel-length modulation’s effects that provide high-accuracy mirroring. Post-layout simulation results using CADENCE for a 180 nm CMOS process are achieved. The designed structure shows a wide input dynamic range of 150 fF with zero power dissipation.
کلیدواژهها [English]
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