Enhanced Fault Detection in MicroLEDs through Microphotoluminescence Microscope Construction

Articles in Press

Document Type : Original Article

Author

School of Mechanical Engineering, Shiraz University, Shiraz, Iran

Abstract

The microphotoluminescence microscope has been developed by integrating 405 nm excitation lasers into a conventional optical microscope system, enabling enhanced characterization of microLED devices. These lasers excite the photoluminescence bands of blue microLEDs, which emit at a wavelength of 450 nm. Defective or short-circuited microLED quantum wells fail to emit light under excitation and thus appear as dark spots in the captured images. This contrast facilitates the automatic identification and mapping of faulty microLEDs through advanced image processing algorithms. Early detection of defective microLEDs at the wafer processing stage within LED manufacturing facilities is crucial, as it allows manufacturers to promptly discard or reprocess faulty wafers, significantly reducing production costs and improving overall yield. Furthermore, the microphotoluminescence microscope provides a powerful tool for quality assurance by enabling detailed comparisons of microLED quality across different wafer batches. It also enhances the detection of substantial defects that can easily be overlooked by conventional microscopy techniques. Overall, the integration of this technology offers a cost-effective and efficient approach for in-line inspection and quality control in microLED production.

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References

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Tabriz Journal of Electrical Engineering

Articles in Press, Corrected Proof
Available Online from 21 October 2024

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